Innovative Semiconductor Test Cell Solutions.

Products

FA Tools offers the semiconductor TAP industry standard and custom product solutions that automate and enhance the performance of the test environment.
Proven Solutions
Test Manager for Wafer Probe
An innovative and flexible test Cell controller

Test Manager for Package Test
A solution to expand and maximize the performance in final test
Wafer-Probe Solutions
test manager for wafer probe
Features:

  • SEMI Standard E142 XML wafermap output
  • Custom wafermap output supported
  • Common GUI (Graphical User Interface)
  • Common XML test recipe setup files across all test platforms
  • Common XML prober setup files for all wafer-prober types
  • Common XML global configuration files
  • Common GPIB prober driver interface for all prober types
  • Built-In Equiment and Performance Monitoring Tools
  • Real-time GUI output of wafer results, current yield, and prober alarms
  • Support for SEMI E142 standard wafermap output
  • Full Equipment Performance Monitor and Reporting
  • Automatic Reprobe support
  • Real-Time Retest
  • Real-time Yield monitoring and Event reporting of all prober events
  • Support for scripting prober events and prober control
  • Support for scripting low-level GPIB commands
  • Support for Real-Time STAT-gate (Statistical Gating)

Customization of summary output GUI, which includes support for displaying the following graphs:
  • Softbin summaries
  • Hardbin summaries
  • Real-time yield trend chart
  • Current site yield chart, and site differential yield limits
  • Common Lot summary output
  • Support for automatic summary generation and distribution
  • Wafer setup management
  • Hot-Chuck and Polish control
  • Prober alarm monitoring and metrics
Test Manager provides a single-screen, standard GUI across all test platforms.

Package-Test Solutions
test manager for package test
Features:

  • Real-time GUI output of handler performance, current yield, and handler alarms
  • Real-time Yield monitoring and Event reporting of all handler events
  • Full Equipment Performance Monitor and Reporting
  • Support or scripting hander events
  • Support for scripting low-level GPIB commands
  • Support for Real-Time STAT-gate (Statistical Gating)
Customization of handler output GUI, which includes support for displaying the following graphs:
  • Softbin summaries
  • Hardbin summaries
  • Real-time yield trend chart
  • Current site yield chart, and site differential yield limits
  • Common Lot summary output
  • Support for automatic summary generation and distribution
  • Accurate retest summary output generation
  • Retest management for retesting rejects
  • Handler setup management
  • Handler setup (temperature, guardbands, etc.)
  • Handler Tray output configuration.
  • Handler alarm monitoring and metrics
Test Manager provides a single-screen, standard GUI across all test platforms.